Test of DINTESPEC in experiment S302

Our team has participated in experiment S302, devoted to the test of the DESPEC implantation stack in the neutron deficient region around 84Mo. The configuration of the DINTESPEC demonstrator consisted of three BB7 wafers, one connected to the AIDA electronics chain and the other two connected to an electronic chain consisting of MPRL-16 preamplifiers and FEBEX ADC digitizers. A new detector-to-preamplifier connection system, consisting of SAMTEC flat cables connected to two adapter cards to transmit the signals from the DSSSDs to the MPRL-16, has been tested.